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On-line Digital-darkfield TEM Determination of Nanocrystal 3D-lattices

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Given a field of view in the TEM that contains many crystals, it has long been possible to form a darkfield image of each diffraction spot, noting which particle lights… Click to show full abstract

Given a field of view in the TEM that contains many crystals, it has long been possible to form a darkfield image of each diffraction spot, noting which particle lights up, and to then tilt to new orientations and repeat the process. By after the fact combining information on tilt and diffraction spot locations, the full 3D reciprocal lattice (or a non-trivial subset thereof) can then be determined for all crystals for which one has data on 3 or more non-coplanar diffraction spots, as can the oriented basis triplet for that crystal should one desire to send the beam down a specified lattice direction in that crystal [1]. Each spot beyond the first 3 also provides information on lattice parameter uncertainties.

Keywords: darkfield tem; line digital; darkfield; tem determination; digital darkfield; tem

Journal Title: Microscopy and Microanalysis
Year Published: 2017

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