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Development of an Efficient Methodology for the Mapping and Digital Analysis of 3D Surfaces via SEM

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Computer-aided image processing will be instrumental in the identification and classification of the various morphological deviations: backscatter electron images will be used to generate a background mask to separate the… Click to show full abstract

Computer-aided image processing will be instrumental in the identification and classification of the various morphological deviations: backscatter electron images will be used to generate a background mask to separate the implanted diamond from the underlying 3.5 mm tip surface, while geodesic active contours will define and monitor fine topographical evolution within individual diamond particles.

Keywords: methodology; efficient methodology; methodology mapping; mapping digital; digital analysis; development efficient

Journal Title: Microscopy and Microanalysis
Year Published: 2017

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