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Numerical Modeling of Specimen Geometry for Quantitative Multiple Detector EDS

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By combining multiple X-ray detectors to enlarge the total detector area, new energy dispersive X-ray spectrometers exhibit dramatically enhanced collection efficiency. This provides significantly higher signal-to-noise ratio, enabling elemental mapping… Click to show full abstract

By combining multiple X-ray detectors to enlarge the total detector area, new energy dispersive X-ray spectrometers exhibit dramatically enhanced collection efficiency. This provides significantly higher signal-to-noise ratio, enabling elemental mapping at the atomic scale [1-4]. The increased complexity in multi-detector systems has also brought new challenges in terms of absorption correction and X-rays being shadowed by holder as a function of tilt. To this end, we have previously developed a numerical that combines detector geometry, holder shadowing, Be filtering, and specimen absorption to quantitatively analyze elemental quantification on an atom-column by atom-column basis [3,5]. The numerical model incorporates detector and holder geometries by angularly discretizing the collected Xrays [5]. The effective detector solid angle, Ωeff is determined by integrating over all discretized X-rays, i, collected from every sample slice along the depth direction, t, and then can be further used to quantify absolute counts and counts ratio of the sample.

Keywords: detector; geometry; numerical modeling; specimen geometry; modeling specimen; geometry quantitative

Journal Title: Microscopy and Microanalysis
Year Published: 2017

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