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Microstructure Patterns by Switching Spectroscopy Piezo-response Force Microscopy of Lead Free Perovskite-type Polycrystalline Thin Films

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1. CONACYT Research Fellow. Centro de Investigación en Materiales Avanzados (CIMAV), Miguel de Cervantes 120, Chihuahua, Chih., Mexico. 2. Laboratorio Nacional de Nanotecnología (NanoTech). Centro de Investigación en Materiales Avanzados… Click to show full abstract

1. CONACYT Research Fellow. Centro de Investigación en Materiales Avanzados (CIMAV), Miguel de Cervantes 120, Chihuahua, Chih., Mexico. 2. Laboratorio Nacional de Nanotecnología (NanoTech). Centro de Investigación en Materiales Avanzados (CIMAV), Miguel de Cervantes 120, Chihuahua, Chih., Mexico. 3. Physics of Materials Department. Centro de Investigación en Materiales Avanzados (CIMAV), Miguel de Cervantes 120, Chihuahua, Chih., Mexico.

Keywords: investigaci materiales; microscopy; centro investigaci; avanzados cimav; materiales avanzados; spectroscopy

Journal Title: Microscopy and Microanalysis
Year Published: 2017

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