Many processes in materials science are dependent on the local environmental conditions (temperature, pressure, gas, liquid etc). Although recent years have seen a paradigm change in (scanning) transmission electron microscopy… Click to show full abstract
Many processes in materials science are dependent on the local environmental conditions (temperature, pressure, gas, liquid etc). Although recent years have seen a paradigm change in (scanning) transmission electron microscopy ((S)TEM) with unprecedented improvements in spatial and spectroscopic resolution being achieved, a full utilization of these new capabilities to study processes requires precise control of the environment around the sample. Further, as nanomaterials are three-dimensional (3-D) in nature, it is not sufficient to take single 2-D projection images of 3-D objects. In order to understand the true nature of the nanomaterial, a 3D tomogram is necessary on the nanoto atomic scale. Traditionally, this involves taking a series of images of the sample at different tilt angles, normally ranging between -70° to +70° every 1 to 2 degrees, and using these two dimensional images to reconstruct a three dimensional volume of the sample. More recently, the development of novel algorithms have greatly aided in the reduction of reconstruction artifacts, and even provided atomic resolution 3-D tomograms from only 3-5 projection images.
               
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