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The development of high-speed pixelated electron detectors has presented many opportunities for Scanning Transmission Electron Microscopy (STEM). The collection of Convergent-Beam Electron Diffraction (CBED) patterns as a function of probe… Click to show full abstract
The development of high-speed pixelated electron detectors has presented many opportunities for Scanning Transmission Electron Microscopy (STEM). The collection of Convergent-Beam Electron Diffraction (CBED) patterns as a function of probe position provides a feature rich data set with many possible means of analysis. These include the reconstruction of conventional imaging modes via the use of virtual apertures, exit wave function reconstruction using ptychography [1], and Differential Phase Contrast (DPC) imaging measuring local electric and magnetic fields [2].
Journal Title: Microscopy and Microanalysis
Year Published: 2018
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