LAUSR

Though the resolution of electron microscopy has increased to a sub-Angstrom level, even a small environmental perturbation will cause loss of resolution. Coupled to low accelerating voltage operation for high resolution EELS with possible monochromated electron energy sources, we can measure quantities such as optical resonances (Fig. 1.) and inter and intra band transitions below the Cherenkov radiation background [1]. These types of measurements require a total systematic design approach that will allow all parts of the instrument to operate within a cocoon of high stability. The new microscope design will include multiple functionality incorporating very long beam path that would be impacted by environmental noise. The physical conditions of the lab room where the electron microscope resides could impact the device by vibration, fluctuating temperature, high humidity and electromagnetic fields. The impacting factors can be classified into three main categories: 1) factors that change the relative position between samples and the probe, 2) factors that affect the detection sensitivity of the probe, and 3) factors that might contaminate or modify the samples.