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It has recently been reported that the Integrated Differential Phase Contrast STEM (iDPC-STEM) technique [1, 2] enables imaging of both light and heavy atoms together in a thin sample at… Click to show full abstract
It has recently been reported that the Integrated Differential Phase Contrast STEM (iDPC-STEM) technique [1, 2] enables imaging of both light and heavy atoms together in a thin sample at sub-Å resolution [3]. Furthermore it has been demonstrated that iDPC-STEM obtains phase images of a size and at the same speed as any conventional STEM technique. Therefore, simultaneous ADF-STEM together with iDPC-STEM has become a standard. This way of acquisition provides complementary information on the sample as well as extra flexibility for focusing, stigmation and sample manipulation.
Journal Title: Microscopy and Microanalysis
Year Published: 2018
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