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Modern microscopy laboratories have, in recent years, witnessed a growth in adoption of X-ray technologies. X-ray techniques offer exceptionally high penetrating powers as compared to conventional electronand optical microscopy approaches,… Click to show full abstract
Modern microscopy laboratories have, in recent years, witnessed a growth in adoption of X-ray technologies. X-ray techniques offer exceptionally high penetrating powers as compared to conventional electronand optical microscopy approaches, providing information about a material’s surface and subsurface with minimal specimen preparation [1]. While these techniques often do not match the spatial resolution capabilities of conventional characterization approaches, such as SEM and TEM, the unique advantages of X-ray techniques for non-destructive characterization have made them a popular choice for correlative microscopy workflows, as an informative step on the way to higher-resolution imaging [2].
Journal Title: Microscopy and Microanalysis
Year Published: 2018
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