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Energy resolution at the Fano limit: The benefits of the principle of sideward depletion for solid state X-ray spectrometry

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In the field of X-ray spectrometry, high-energy resolution and low-energy detection capability are important requirements. The energy resolution of a detector system depends on the intrinsic resolution of the detector… Click to show full abstract

In the field of X-ray spectrometry, high-energy resolution and low-energy detection capability are important requirements. The energy resolution of a detector system depends on the intrinsic resolution of the detector chip and on the electronic noise of the system. The intrinsic resolution of the detector chip is based on statistical fluctuations of the signal conversion mechanism and defines a lower limit of the best achievable energy resolution, which is called the Fano limit. The noise, which is added by the readout electronics, depends on the detector characteristics, consisting of leakage current and output capacitance and on the characteristics of the front-end electronics. In order to improve the energy resolution, the detector capacitance and the stray capacitance connected to the output node should be as small as possible.

Keywords: resolution; energy; limit; detector; ray spectrometry; energy resolution

Journal Title: Microscopy and Microanalysis
Year Published: 2018

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