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Soft Matter X-ray Microanalysis in the Analytical Electron Microscope

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The recent developments in large solid angle x-ray detectors [1] has not only increased the ability of microanalysts today to perform high spatial resolution spectroscopy in the Analytical Electron Microscope… Click to show full abstract

The recent developments in large solid angle x-ray detectors [1] has not only increased the ability of microanalysts today to perform high spatial resolution spectroscopy in the Analytical Electron Microscope (AEM) during materials science investigations, but it has also opened up opportunities to begin studying more challenging systems involving soft-matter and/or biological systems including experiments involving cryo-EM. In order to assess the viability of the new detector geometries, experiments have been performed using an FEI Titan AEM, equipped with the most recent generation of Dual X SDD systems developed by Thermo Fischer Scientific and Bruker. Two different and challenging system were chozen to test the veracity as detailed below.

Keywords: soft matter; ray; electron microscope; analytical electron

Journal Title: Microscopy and Microanalysis
Year Published: 2018

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