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Focused electron beam or electron probe in an environmental scanning electron microscope (ESEM) is used to ablate and image a thin layer of mixed organic and inorganic interface between the… Click to show full abstract
Focused electron beam or electron probe in an environmental scanning electron microscope (ESEM) is used to ablate and image a thin layer of mixed organic and inorganic interface between the human tooth’s dentin and enamel phases. This thin layer is called the dentin-enamel junction (DEJ). Characterization of the DEJ properties, such as chemistry, width, morphology and microstructures, are critical for understanding tooth’s biomechanical behavior, radiotherapy effect on the tooth, and other interfaces joining dissimilar materials [1, 2].
Journal Title: Microscopy and Microanalysis
Year Published: 2018
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