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Continuous Wavelet Transforms for Measuring Roughness of Nanoscale Interfaces

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The IR determines the electron transport properties along the interface, and so interfaces can be designed for specific desired outcomes [1]. To be able to relate IR to electron transport… Click to show full abstract

The IR determines the electron transport properties along the interface, and so interfaces can be designed for specific desired outcomes [1]. To be able to relate IR to electron transport properties a detailed description that extracts the salient features of the interface morphology yet provides a condensed interpretation of the IR is necessary. The ideal IR description should allow comparison between IR measurements using any method, should not be sensitive to changes in signal to noise ratio (SNR), and should be able to extract sudden peaks in the interface.

Keywords: nanoscale interfaces; continuous wavelet; roughness nanoscale; measuring roughness; wavelet transforms; transforms measuring

Journal Title: Microscopy and Microanalysis
Year Published: 2018

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