LAUSR

Micro-XRF, as an analytical tool, combines several features, making it ideal for investigation of forensic samples. The technique can be used to scan large areas, provides simultaneous information on multiple elements down to the trace element level, can be applied under ambient conditions and is non-invasive. Furthermore, the requirement in forensics to not alter or damage the specimen suits this technique perfectly, as it requires no or little preparation of the sample, other than fixing it to the stage or flattening the specimen, as can be seen in Figure 1a.