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In-situ TEM Characterization of Ultra-robust Memristors Based on Fully Layered Two-dimensional Materials

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1. National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China. 2. School of Physics, Collaborative Innovation… Click to show full abstract

1. National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China. 2. School of Physics, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China. 3. Department of Chemical Engineering and Materials Science and Department of Physics and Astronomy, University of California, Irvine, CA, USA. 4. Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA.

Keywords: characterization ultra; tem characterization; situ tem; physics; university; ultra robust

Journal Title: Microscopy and Microanalysis
Year Published: 2018

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