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Beamline 2-ID-D/E at the APS provide advanced scanning microprobe capabilities to diverse user communities such as materials science, energy science, environmental science, life science. Applications include, for instance, measuring microelectronics… Click to show full abstract
Beamline 2-ID-D/E at the APS provide advanced scanning microprobe capabilities to diverse user communities such as materials science, energy science, environmental science, life science. Applications include, for instance, measuring microelectronics defects in 3D, local structure and electronics state in advanced photovoltaic materials, elemental content and oxidation state of aerosol particles, exogenous and endogenous metal distribution in cells and tissues. Station 2-ID-D currently hosts two instruments: an XRF/XANES microprobe with 200-nm resolution [1], and a fast ptychography instrument called the Velociprobe [2]. Station 2-ID-E hosts an XRF microprobe with tomographic capability. All three scanning probes utilize Fresnel zone plates as the microfocusing optics.
Journal Title: Microscopy and Microanalysis
Year Published: 2018
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