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Hard X-ray spectromicroscopy techniques are key tools with relevant applications across multiple fields. Here we briefly describe how these tools are implemented and used nowadays for the characterization of heterogeneous… Click to show full abstract
Hard X-ray spectromicroscopy techniques are key tools with relevant applications across multiple fields. Here we briefly describe how these tools are implemented and used nowadays for the characterization of heterogeneous materials at the nanoscale. We shortly present the essential role of the associated instrumentation for reliable 2D and 3D data acquisitions with nanometer spatial resolution. Two examples exemplify the potential of hard X-ray modalities to provide new insights into hybrid perovskites for solar cells and nanowires for light emitting diodes.
Journal Title: Microscopy and Microanalysis
Year Published: 2018
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