LAUSR.org creates dashboard-style pages of related content for over 1.5 million academic articles. Sign Up to like articles & get recommendations!

In-Plane Magnetic Field Evaluation with 0.47-nm Resolution by Aberration-Corrected 1.2-MV Holography Electron Microscope

1. Research & Development Group, Hitachi, Ltd., Hatoyama, Japan. 2. RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan. 3. HREM Research Inc., Matsukazedai, Japan. 4. Department of Applied Quantum… Click to show full abstract

1. Research & Development Group, Hitachi, Ltd., Hatoyama, Japan. 2. RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan. 3. HREM Research Inc., Matsukazedai, Japan. 4. Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka, Japan. 5. National Institute for Materials Science, Tsukuba, Japan. 6. National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan. 7. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan. 8. Department of Applied Physics, The University of Tokyo, Tokyo, Japan. * Corresponding author: [email protected]

Keywords: field evaluation; physics; plane magnetic; magnetic field; japan; evaluation resolution

Journal Title: Microscopy and Microanalysis
Year Published: 2019

Link to full text (if available)


Share on Social Media:                               Sign Up to like & get
recommendations!

Related content

More Information              News              Social Media              Video              Recommended



                Click one of the above tabs to view related content.