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ZEISS Orion NanoFab New Features: “Shuttle and Find” and Automation

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Shuttle and Find helps to solve the difficulty for the microscopist who seeks to examine progressively smaller features using an increasingly large collection of imaging and analytical instruments. The difficultly… Click to show full abstract

Shuttle and Find helps to solve the difficulty for the microscopist who seeks to examine progressively smaller features using an increasingly large collection of imaging and analytical instruments. The difficultly is most keenly felt when the feature of interest is not recognizable without resorting to very high magnification, which of course necessitates searching though many images to relocate the same feature in a second instrument. The problem originates because different instruments’ coordinate systems are not universal, and because sample mounting cannot be perfectly repeated.

Keywords: features shuttle; new features; orion nanofab; nanofab new; shuttle find; zeiss orion

Journal Title: Microscopy and Microanalysis
Year Published: 2019

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