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Use of Negative Bias Potential for High Throughput Array Tomography in an Integrated Light-Electron Microscope

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Volume electron microscopy (EM) has progressively become a driving force in exploring and analysing three-dimensional biological structures across ever-increasing spatial scales. While advances in technology and automation have revolutionized imaging… Click to show full abstract

Volume electron microscopy (EM) has progressively become a driving force in exploring and analysing three-dimensional biological structures across ever-increasing spatial scales. While advances in technology and automation have revolutionized imaging capabilities, low throughput persists as the primary limitation to achieving larger and larger volumes [1]. One strategy for increasing throughput is to combine a fluorescence and electron microscope together into one integrated system. Doing so provides the advantage of being able to use fluorescence expression as a guide for selecting regions of interest for high resolution EM imaging [2].

Keywords: microscopy; throughput; electron microscope; bias potential; use negative; negative bias

Journal Title: Microscopy and Microanalysis
Year Published: 2019

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