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Correlative Synchrotron Micro-CT and FIB-SEM Imaging for the Analysis of Multifocal Pathologies

1 GW Nanofabrication and Imaging Center, Office of the Vice President for Research, George Washington University, Washington DC, USA. 2 Center for Nanotechnology Innovation @NEST, Istituto Italiano di Tecnologia, Pisa,… Click to show full abstract

1 GW Nanofabrication and Imaging Center, Office of the Vice President for Research, George Washington University, Washington DC, USA. 2 Center for Nanotechnology Innovation @NEST, Istituto Italiano di Tecnologia, Pisa, Italy. 3 Dipartimento di Medicina e Chirurgia, Experimental Neurology Unit, Università degli Studi di MilanoBicocca, Monza, Italy. 4 Elettra Sincrotrone Trieste S.C.p.A., Basovizza, Italy. 5 Institute for Neuroscience and Department of Pharmacology and Physiology, George Washington University School of Medicine and Health Sciences, Washington DC, USA. * Corresponding author: [email protected]

Keywords: fib sem; correlative synchrotron; synchrotron micro; sem imaging; imaging analysis; micro fib

Journal Title: Microscopy and Microanalysis
Year Published: 2019

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