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Pioneering work of the Zewail group has shown it possible to study semiconductor carrier dynamics by photoexciting semiconductor materials and probing the carrier induced change of secondary electron (SE) yield… Click to show full abstract
Pioneering work of the Zewail group has shown it possible to study semiconductor carrier dynamics by photoexciting semiconductor materials and probing the carrier induced change of secondary electron (SE) yield in a scanning electron microscope (SEM) [1]. A pump probe scheme where carriers are created with a fs laser pulse and subsequently detected with an electron pulse arriving with adjustable delay, can therefore be used to image carrier dynamics in space and time, with resolution down to tens of microns demonstrated thus far [2].
Journal Title: Microscopy and Microanalysis
Year Published: 2019
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