LAUSR

In a nanocrystalline Cu specimen, the TKD analysis indexed more grains with a higher confidence than PED, Figure 1(a). The origin of the difference is explained by how the diffraction patterns are captured. In TKD, the diffraction events are derived from within a few to ten nanometers of the exiting surface. In this case, the diffraction is then limited (typically) from a single grain that satisfies the Kikuchi diffraction condition even if other scattering events may have occurred above the exiting grain. In PED, the diffraction events are an integration through the entirety of the foil, thus the collected patterns can be a convolution if more than one grain’s diffraction pattern overlaps. Nonetheless, when the grains did not overlap, PED’s spatial resolution for mapping the smallest grains was more evident as compared to TKD.