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Optimizing Specimen Thickness by Measuring Stain Density in STEM Tomography of Cells and Tissues

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Stain density is an important parameter for optimizing the quality of ultrastructural data obtained from several types of 3D electron microscopy techniques, including serial block-face electron microscopy (SBEM), focused ion… Click to show full abstract

Stain density is an important parameter for optimizing the quality of ultrastructural data obtained from several types of 3D electron microscopy techniques, including serial block-face electron microscopy (SBEM), focused ion beam scanning electron microscopy (FIB-SEM) and axial bright-field STEM tomography. A simple expression is derived to determine the stain density based on straightforward measurements in the TEM [1]. Numbers of stain atoms per unit volume are determined from the measured ratio of the bright-field intensities from regions of the specimen that contain both pure embedding material and the embedded biological structures of interest. The determination only requires knowledge of the section thickness, which can either be estimated from the microtome setting, or from low-dose electron tomography, and the elastic scattering cross section for the heavy atoms used to stain the specimen.

Keywords: stain density; stem tomography; microscopy

Journal Title: Microscopy and Microanalysis
Year Published: 2020

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