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Low-voltage aberration-corrected transmission electron microscopy (TEM) allows in-situ imaging of atomic migration processes in two-dimensional (2D) materials. 2D transition metal dichalcogenides (TMDs) have received great attention in recent years due… Click to show full abstract
Low-voltage aberration-corrected transmission electron microscopy (TEM) allows in-situ imaging of atomic migration processes in two-dimensional (2D) materials. 2D transition metal dichalcogenides (TMDs) have received great attention in recent years due to their unique properties, they enable a wide range of applications in the fields of electronics, optoelectronics, sensor and quantum technologies [1]. In
Keywords:
migration processes;
electron beam;
atomic migration;
microscopy
Journal Title: Microscopy and Microanalysis
Year Published: 2020
Link to full text (if available)
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Journal Title: Microscopy and Microanalysis
Year Published: 2020
Link to full text (if available)
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recommendations!