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Scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS) can provide detailed structural and chemical characterization across a wide range of materials and length scales. Especially when atomic… Click to show full abstract
Scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS) can provide detailed structural and chemical characterization across a wide range of materials and length scales. Especially when atomic lattice-scale variations can enhance or quench exotic material properties, STEM-EELS is a powerful tool for probing the chemical or electronic structure of these materials at the atomic scale. The push for such robust, sensitive, and localized characterization is enabled by significant and ongoing improvements to hardware throughout the STEM-EELS instrument. As a case study to highlight several of these advances, we discuss key technical components in a series of experiments
Journal Title: Microscopy and Microanalysis
Year Published: 2020
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