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4D STEM measurements, I(r, k), with nanometer size electron probe beams offer a unique window into the structure of glassy materials. The acquired 4D dataset can be analyzed to determine… Click to show full abstract
4D STEM measurements, I(r, k), with nanometer size electron probe beams offer a unique window into the structure of glassy materials. The acquired 4D dataset can be analyzed to determine spatial fluctuations in the diffracted intensity, which is fluctuation electron microscopy (FEM) [1], or analyzed to determine the angular correlations within each pattern, which measures the rotational symmetries of the diffracting structures. Both methods provide statistical descriptions of the glass structure, and angular correlations allow for real space structure mapping [2]. Together, these methods provide complementary probes of glass structure.
Journal Title: Microscopy and Microanalysis
Year Published: 2020
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