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Towards Crystallographic Orientation and Strain Mapping of 1D & 2D Tellurium from 4D-STEM

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Tellurium nanostructures are attractive candidates for future electronic and functional materials due to their narrow band-gap and tunable electronic and optical properties [1, 2]). The anisotropic helical crystal structure of… Click to show full abstract

Tellurium nanostructures are attractive candidates for future electronic and functional materials due to their narrow band-gap and tunable electronic and optical properties [1, 2]). The anisotropic helical crystal structure of trigonal tellurium (t-Te) and the weak van der Waals stacking of its layers; allows the formation of a variety of 1D nanostructures such as nanowires and nanobelts. A kinematically driven growth can promote the formation of 2D tellurium known as tellurene. Standard HRTEM images provide localized crystallographic information, which usually leaves out larger-scale structural components. Longrange strain fields, caused by lattice misorientation, defects, or anisotropic growth, is often not fully captured in this type of analysis. 4D-STEM provides a remarkable tool for structural analysis across many length scales, and enables extracting the crystalline structure, orientation, virtual images, and strain maps of a wide variety of nanomaterials [3].

Keywords: crystallographic orientation; towards crystallographic; orientation strain; stem; tellurium

Journal Title: Microscopy and Microanalysis
Year Published: 2020

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