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Detailed knowledge of mechanisms of electron scattering and its practical consequences for very low energies are of prime importance for not only measurement techniques but also for development of new… Click to show full abstract
Detailed knowledge of mechanisms of electron scattering and its practical consequences for very low energies are of prime importance for not only measurement techniques but also for development of new materials for electronic devices of the next generation. Low thickness of 2D materials motivated us to develop unique device analyzing samples via transmitted electrons in a standard microscopic regime and also via time-of-flight (ToF) spectroscopic method.
Keywords:
spectroscopy;
low energy;
energy electron;
electron transmission;
transmission spectroscopy;
spectroscopy materials
Journal Title: Microscopy and Microanalysis
Year Published: 2020
Link to full text (if available)
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Journal Title: Microscopy and Microanalysis
Year Published: 2020
Link to full text (if available)
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recommendations!