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Thermal Properties, Molecular Structure, and Thin-Film Organic Semiconductor Crystallization

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The crystallinity of a group of organic small molecules is investigated by vapor depositing the materials into thin films followed by a thermal annealing step. The materials are categorized into… Click to show full abstract

The crystallinity of a group of organic small molecules is investigated by vapor depositing the materials into thin films followed by a thermal annealing step. The materials are categorized into three groups: platelet-forming, spheruliteforming, and those that resist crystallization. Differential scanning calorimetry is utilized to determine the bulk thermal properties of these materials, which provide a reliable indicator of a material’s crystallization motif. Platelet-forming materials tend to be characterized by high melting points (Tm) and high magnitude crystallization driving force at the material’s crystallization temperature (ΔGc). The materials that resist crystallization as a thin film have small ΔGc. These results provide guidelines that can help determine which organic molecules have a greater likelihood of growing into large-scale crystalline frameworks, a key step for improving the charge carrier mobility and exciton diffusion length in organic semiconductors.

Keywords: molecular structure; crystallization; thin film; properties molecular; thermal properties

Journal Title: Journal of Physical Chemistry C
Year Published: 2020

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