Force modulation microscopy (FMM) is a mode of scanning probe microscopy that can be used to visualize changes of tip–sample interactions for hard and soft areas of samples such as… Click to show full abstract
Force modulation microscopy (FMM) is a mode of scanning probe microscopy that can be used to visualize changes of tip–sample interactions for hard and soft areas of samples such as polymers and organic thin films. In designed experiments, polystyrene-encapsulated cobalt nanoparticles were imaged with FMM using a home-built sample stage for sample actuation. Regions of the outer polymer coating and the inner cobalt nanoparticle were resolved with high resolution. Using FMM, differences in the elastic and viscoelastic properties of the nanoparticles were visualized with nanoscale resolution by monitoring the return amplitude and phase signals as the AFM tip is scanned over areas of a sample. Regions of the sample with greater elasticity and viscoelasticity generate a weaker signal relative to harder areas because more of the energy associated with the cantilever oscillation is dissipated by the material. Areas with greater elasticity will tend to absorb more of the energy of the cantilever causing the ampli...
               
Click one of the above tabs to view related content.