Normal flat panel X-ray detectors are confined in imaging of curved surfaces and three-dimensional objects. Except that, their rigid panels provide uncomfortable user experience in medical diagnosis. Here, we report… Click to show full abstract
Normal flat panel X-ray detectors are confined in imaging of curved surfaces and three-dimensional objects. Except that, their rigid panels provide uncomfortable user experience in medical diagnosis. Here, we report a flexible X-ray detector fabricated by the combination of a lead-free Cs2TeI6 perovskite film and a polyimide (PI) substrate. High-quality Cs2TeI6 polycrystalline films are prepared by a low-temperature electrospraying method. The resistivity even remained at the level of 1011 Ω·cm after 100 cycles of bending tests with a low bending radius of 10 mm. The resulting flexible Cs2TeI6 detectors exhibit better response stability than those based on rigid SnO2:F glass (FTO), which is attributed to the superior crystallization of films and the growth stress relief of flexible substrates. Furthermore, an X-ray sensitivity of 76.27 μC·Gyair-1·cm-2 and a detection limit of 0.17 μGyair·s-1 are achieved. A series of distortion-free clear X-ray images are obtained for objects with different materials and densities. These findings provide insights into flexible X-ray detectors based on perovskite films and motivate research in wearable X-ray detectors for medical radiography and dose monitoring.
               
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