LAUSR

BaSi2 is a promising absorber material for next-generation thin-film solar cells (TFSCs). For high-efficiency TFSCs, a suitable interlayer should be found for every light absorber. However, such an interlayer has not been studied for BaSi2. In this study, we investigated amorphous Zn1-xGexOy films as interlayers for BaSi2. The Zn/Ge atomic ratio in the Zn1-xGexOy film and the optical band gap depend on the substrate temperature during sputtering deposition. A suitable i-Zn1-xGexOy/BaSi2 heterointerface with spike-type conduction band offset was achieved when Zn1-xGexOy was deposited on BaSi2 at 50 °C. Furthermore, photoresponsivity measurements revealed that Zn1-xGexOy has an excellent surface passivation effect on BaSi2. When the thickness of Zn1-xGexOy was 2 nm, a high photoresponsivity of 0.9 A/W was obtained for a 500 nm thick BaSi2 layer at a wavelength of 780 nm under an applied bias voltage of 0.5 V between the front and rear electrodes, where the photoresponsivity in the short-wavelength region was significantly improved compared with that of BaSi2 capped with an amorphous Si layer. X-ray photoelectron spectroscopy revealed that the Zn1-xGexOy films suppressed the oxidation of the BaSi2 surface, decreasing the carrier recombination rate. This is the first demonstration of passivation interlayers for BaSi2 with suitable band alignment for carrier transport and surface passivation effects.