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Defect Reconstruction Triggered Full-Color Photodetection in Single Nanowire Phototransistor

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The coherent developments of high performance broadband photodetection and a discrimination technique are highly essential for multiscene imaging and optical communication applications. The integration of traditional bandpass filters or stacking… Click to show full abstract

The coherent developments of high performance broadband photodetection and a discrimination technique are highly essential for multiscene imaging and optical communication applications. The integration of traditional bandpass filters or stacking other spectral absorber in photodetectors often complicates the device design and leads to asymmetric photogain for each waveband. Herein, we report on ultraviolet–visible (UV-vis) multispectral photodetection based on a single ZnO nanowire (NW) phototransistor, where defect reconstructions can be reliably induced by a two-step annealing that leads to the observed broadband photodetection. Electron paramagnetic resonance and photoluminescence spectra reveal the reconstructions of zinc-atom-related defects (i.e., zinc interstitials and vacancies). Combined microdifferential reflectance and multimode scanning probe microscope (SPM) technique confirm the presence of a unique visible-sensitive Zn-rich ZnO shell layer and a trap-free UV-sensitive ZnO core. We achieve n...

Keywords: phototransistor defect; nanowire phototransistor; photodetection; defect reconstruction

Journal Title: ACS Photonics
Year Published: 2019

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