The formation of interfacial deep-level traps in the polymer matrix presents an opportunity to enhance the dielectric breakdown strength (BDS) of high dielectric constant in electrically insulative PVDF films. In… Click to show full abstract
The formation of interfacial deep-level traps in the polymer matrix presents an opportunity to enhance the dielectric breakdown strength (BDS) of high dielectric constant in electrically insulative PVDF films. In this work, star-shaped donor–acceptor (D–A) molecules (S1, S2 and S3) with three electron-donating arms surrounding an electron-accepting core are incorporated into PVDF-t films using a facile solution casting process. It is found that the DC electrical insulation of the fabricated films is remarkably improved with the additive introduction. An outstanding BDS enhancement of 27% is achieved by PVDF/S3 films with 0.1 wt% of adding content. Analysis using displacement–electric (D–E) field hysteresis loops reveals that there is notable reduction of carrier density in polymer films under a high electric field. It is believed that D–A molecules serve as effective traps to capture highly energetic carriers, resulting in the dielectric breakdown occurring at a higher level. Our findings present that D–A molecules can be a new family of additive candidates for PVDF-t dielectrics to achieve improved electrical insulation.
               
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