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This work demonstrates the use of reflection–adsorption infrared spectroscopy for continually monitoring the structure of organic thin films as a function of thickness and temperature to complement diffraction methods. Click to show full abstract
This work demonstrates the use of reflection–adsorption infrared spectroscopy for continually monitoring the structure of organic thin films as a function of thickness and temperature to complement diffraction methods.
Keywords:
thin films;
organic thin;
infrared spectroscopic;
structure organic;
spectroscopic measurements
Journal Title: CrystEngComm
Year Published: 2021
Link to full text (if available)
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Journal Title: CrystEngComm
Year Published: 2021
Link to full text (if available)
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recommendations!