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A fast and low-cost method for the highly selective determination of ultra-trace Hg(ii) ions at ppt level using total-reflection X-ray fluorescence spectrometry. Click to show full abstract
A fast and low-cost method for the highly selective determination of ultra-trace Hg(ii) ions at ppt level using total-reflection X-ray fluorescence spectrometry.
Keywords:
reflection ray;
total reflection;
spectrometry;
highly selective;
fluorescence spectrometry;
ray fluorescence
Journal Title: Journal of Analytical Atomic Spectrometry
Year Published: 2021
Link to full text (if available)
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Journal Title: Journal of Analytical Atomic Spectrometry
Year Published: 2021
Link to full text (if available)
Share on Social Media: Sign Up to like & get
recommendations!