LAUSR

A method leveraging Rietveld full-pattern texture analysis to decouple induced domain texture from a preferred grain orientation is presented. The proposed method is demonstrated by determining the induced domain texture in a polar polymorph of 100 oriented 0.91Bi1/2Na1/2TiO3-0.07BaTiO3-0.02K0.5Na0.5NbO3. Domain textures determined using the present method are compared with results obtained via single peak fitting. Texture determined using single peak fitting estimated more domain alignment than that determined using the Rietveld based method. These results suggest that the combination of grain texture and phase transitions can lead to single peak fitting under or over estimating domain texture. While demonstrated for a bulk piezoelectric, the proposed method can be applied to quantify domain textures in multi-component systems and thin films.