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Influence of neighboring coupling on metal-insulator-semiconductor (MIS) deep-depletion tunneling current via Schottky barrier height modulation mechanism

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A metal-insulator-semiconductor (MIS) tunneling diode is a very promising sensor due to its deep depletion phenomenon. The coupling effect between two adjacent devices is therefore of importance. To study the… Click to show full abstract

A metal-insulator-semiconductor (MIS) tunneling diode is a very promising sensor due to its deep depletion phenomenon. The coupling effect between two adjacent devices is therefore of importance. To study the MIS deep-depletion tunneling current coupling phenomenon, a device pattern of one centric circle coupled with one or two surrounding rings was devised. It was found that MIS(p) tunneling current with the Schottky barrier height modulation mechanism is enhanced just by locating more MIS(p) structures nearby or by shortening their relative distance, which can again be verified under light exposure. The MIS(n) structure was also fabricated for comparison. It was observed in MIS(n) that, with the lack of the Schottky barrier height modulation mechanism, tunneling current is greater and almost immune to light irradiance compared to MIS(p). Besides, the edge oxide of MIS(p) is removed to change its Schottky barrier height modulation capability. Significantly lower deep-depletion tunneling current and invul...

Keywords: schottky barrier; deep depletion; barrier height; mis; tunneling current; height modulation

Journal Title: Journal of Applied Physics
Year Published: 2017

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