Electron energy-loss spectroscopy (EELS) using a scanning transmission electron microscope (STEM) provides information on the local electronic structure around an atomic column irradiated by the incident electron probe. In this… Click to show full abstract
Electron energy-loss spectroscopy (EELS) using a scanning transmission electron microscope (STEM) provides information on the local electronic structure around an atomic column irradiated by the incident electron probe. In this study, we present a method for detecting the directionality of chemical bonds with atomic resolution by selecting a specific atomic column and the direction of momentum transfer with an off-axis collection aperture in the STEM-EELS measurement. It is shown that the oxygen K-edge fine structures in SrTiO3 measured from the crystallographically equivalent oxygen sites, which are in TiO-planes perpendicular to the electron probe direction, show different structures depending on the directionality of the σ-bond between the oxygen and titanium atoms. This method opens up a way to explore the electronic states in anisotropic materials and interfaces with atomic resolution.Electron energy-loss spectroscopy (EELS) using a scanning transmission electron microscope (STEM) provides information on the local electronic structure around an atomic column irradiated by the incident electron probe. In this study, we present a method for detecting the directionality of chemical bonds with atomic resolution by selecting a specific atomic column and the direction of momentum transfer with an off-axis collection aperture in the STEM-EELS measurement. It is shown that the oxygen K-edge fine structures in SrTiO3 measured from the crystallographically equivalent oxygen sites, which are in TiO-planes perpendicular to the electron probe direction, show different structures depending on the directionality of the σ-bond between the oxygen and titanium atoms. This method opens up a way to explore the electronic states in anisotropic materials and interfaces with atomic resolution.
               
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