In this study, the effect of aging on current transport properties and the interface band structure of the Au/Nb-doped SrTiO3 (NSTO) junction was investigated. The as-fabricated Au/NSTO junctions showed extremely… Click to show full abstract
In this study, the effect of aging on current transport properties and the interface band structure of the Au/Nb-doped SrTiO3 (NSTO) junction was investigated. The as-fabricated Au/NSTO junctions showed extremely small rectification and exhibited rectifying current conduction and colossal electroresistance (CER) effect after exposure to air. In contrast, the Au/NSTO junctions kept in vacuum did not exhibit such aging behavior. Interestingly, the Au/NSTO junction capped with a Pt overlayer showed small rectification even after air exposure for one week. The changes in the potential profile with increasing air exposure time were assessed by X-ray photoemission techniques. The aforementioned time-dependent behaviors originated because of oxygen diffusion through the Au electrode, and it was found that oxygen stoichiometry at the electrode interface played an important role in the CER phenomena at the metal/NSTO junctions.In this study, the effect of aging on current transport properties and the interface band structure of the Au/Nb-doped SrTiO3 (NSTO) junction was investigated. The as-fabricated Au/NSTO junctions showed extremely small rectification and exhibited rectifying current conduction and colossal electroresistance (CER) effect after exposure to air. In contrast, the Au/NSTO junctions kept in vacuum did not exhibit such aging behavior. Interestingly, the Au/NSTO junction capped with a Pt overlayer showed small rectification even after air exposure for one week. The changes in the potential profile with increasing air exposure time were assessed by X-ray photoemission techniques. The aforementioned time-dependent behaviors originated because of oxygen diffusion through the Au electrode, and it was found that oxygen stoichiometry at the electrode interface played an important role in the CER phenomena at the metal/NSTO junctions.
               
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