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The electron reflectivity from NiO thin films grown on Ag(001) has been systematically studied as a function of film thickness and electron energy. A strong electron quantum interference effect was… Click to show full abstract
The electron reflectivity from NiO thin films grown on Ag(001) has been systematically studied as a function of film thickness and electron energy. A strong electron quantum interference effect was observed from the NiO film, which is used to derive the unoccupied band dispersion above the Fermi surface along the Γ−X direction using the phase accumulation model. The experimental bands agree well with first-principles calculations. A weaker electron quantum interference effect was also observed from the CoO film.
Keywords:
quantum interference;
thin films;
nio thin;
electron quantum
Journal Title: AIP Advances
Year Published: 2020
Link to full text (if available)
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Journal Title: AIP Advances
Year Published: 2020
Link to full text (if available)
Share on Social Media: Sign Up to like & get
recommendations!