LAUSR

Three dimensional (3D) information of the microstructure organization of various relevant materials in industry and nature is fundamental to master the understanding of their macroscopic properties. X-ray scattering tensor tomography provides 3D directional information on unresolved microstructures in large volumes, facilitating the investigation of the microstructural organization in statistically large enough sample portions. However, established acquisition protocols such as scanning small angle x-ray scattering and x-ray grating interferometry require long measurement time. In this Letter, a rapid x-ray scattering tensor tomography acquisition method is proposed. It is based on circular gratings, which provide single-shot 2D-omnidirectional information of the sample scattering properties. The main advantage of the presented method is the reduced data acquisition time compared to the existing protocols for x-ray scattering tensor tomography, paving the way toward rapid time-resolved studies.