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In this paper, we show how the combined use of low-coherence interferometry, balanced detection, and data processing comparable to that used in Fourier transform spectrometry allows us to characterize with… Click to show full abstract
In this paper, we show how the combined use of low-coherence interferometry, balanced detection, and data processing comparable to that used in Fourier transform spectrometry allows us to characterize with ultimate resolutions (sub-parts per million in level, 0.2 nm in wavelength, and 25 mdeg in angle) the retro-reflection and retro-scattering response of both sides of a 2 mm thick silica wafer.
Keywords:
interferometric measurement;
coherence;
low coherence;
coherence interferometric;
spatial frequency;
measurement spatial
Journal Title: Applied Physics Letters
Year Published: 2023
Link to full text (if available)
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Journal Title: Applied Physics Letters
Year Published: 2023
Link to full text (if available)
Share on Social Media: Sign Up to like & get
recommendations!