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Interferometric mapping of material properties using thermal perturbation

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Significance Rapid, accurate, and nondestructive mapping of material properties is of great interest in many fields, with applications ranging from detection of defects or other subsurface features in semiconductors to… Click to show full abstract

Significance Rapid, accurate, and nondestructive mapping of material properties is of great interest in many fields, with applications ranging from detection of defects or other subsurface features in semiconductors to estimating temperature rise in various tissue layers during laser therapy. We demonstrate the speed and precision of two interferometric techniques, quantitative phase imaging and phase-resolved optical coherence tomography, in recording optical phase changes induced by energy deposition in various materials. Such phase perturbations can be used to infer sample properties, ranging from absorption and temperature maps to distribution of electric field or resistivity. We derive the theoretical sensitivity limits of such techniques and demonstrate their applicability to the mapping of absorption coefficients, temperature, and electric fields in synthetic and biological samples. Optical phase changes induced by transient perturbations provide a sensitive measure of material properties. We demonstrate the high sensitivity and speed of such methods, using two interferometric techniques: quantitative phase imaging (QPI) in transmission and phase-resolved optical coherence tomography (OCT) in reflection. Shot-noise–limited QPI can resolve energy deposition of about 3.4 mJ/cm2 in a single pulse, which corresponds to 0.8 °C temperature rise in a single cell. OCT can detect deposition of 24 mJ/cm2 energy between two scattering interfaces producing signals with about 30-dB signal-to-noise ratio (SNR), and 4.7 mJ/cm2 when SNR is 45 dB. Both techniques can image thermal changes within the thermal confinement time, which enables accurate single-shot mapping of absorption coefficients even in highly scattering samples, as well as electrical conductivity and many other material properties in biological samples at cellular scale. Integration of the phase changes along the beam path helps increase sensitivity, and the signal relaxation time reveals the size of hidden objects. These methods may enable multiple applications, ranging from temperature-controlled retinal laser therapy or gene expression to mapping electric current density and characterization of semiconductor devices with rapid pump–probe measurements.

Keywords: phase; temperature; mapping material; phase changes; material properties

Journal Title: Proceedings of the National Academy of Sciences of the United States of America
Year Published: 2018

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