Abstract SiO2 doped BSTS ceramics were obtained by the conventional electroceramic processing. XRD was performed to confirm the phase. Meanwhile, the SEM images show the direct proof of the second… Click to show full abstract
Abstract SiO2 doped BSTS ceramics were obtained by the conventional electroceramic processing. XRD was performed to confirm the phase. Meanwhile, the SEM images show the direct proof of the second phase, which is in good agreement with XRD results. The formed second phase have effect on the densification and dielectric properties, which will be further analyzed and discussed in the study.
               
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