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CDF and MGF based analysis over Rayleigh TWDP shadowed fading channel for indoor communication

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ABSTRACT Recently, the two-wave with diffuse power (TWDP) distribution has been extensively used to model the shadowing in multipath-faded/shadowed indoor environment. In this article, novel expressions for joint moments, mean,… Click to show full abstract

ABSTRACT Recently, the two-wave with diffuse power (TWDP) distribution has been extensively used to model the shadowing in multipath-faded/shadowed indoor environment. In this article, novel expressions for joint moments, mean, second moment, variance and cumulative distribution function for Rayleigh TWDP shadowed fading model are derived. By using the derived expression of mean and variance, the expression for amount of fading is obtained. Also, the outage probability, moment generating function and average bit error rate (ABER) for various modulation schemes namely binary phase shift keying (BPSK), binary frequency shift keying (BFSK), minimum shift keying (MSK), differentially coherent phase shift keying (DCPSK) and non-coherent frequency shift keying (NCFSK) are calculated. The derived expressions for cumulative distribution function, outage probability and ABER are presented in analytical format and have been numerically evaluated. Moreover, the numerical results of ABER using MSK and DPSK modulation schemes is compare with results of Rayleigh Gamma composite fading model. The study shows that better outage probability (0.01) is observed at 40dB average signal to noise ratio (SNR) with 5dB lowest threshold SNR, however, at higher threshold SNR (>5dB) with fixed average SNR (40dB), poor outage probability performance are obtained. Further, at higher shadowing (10dB), for fixed average SNR (15dB), minimum error probability (10−4) is observe, while at lower shadowing (less than 10dB), higher error probability (greater than 10−4) is observed that represents poor BER performance.

Keywords: shift keying; rayleigh twdp; probability; twdp shadowed

Journal Title: International Journal of Electronics
Year Published: 2018

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