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An Approach for Detection and Localization of Missing Gate Faults in Reversible Circuit

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Power consumption issues in VLSI circuits have resulted in the emergence of promising technologies – like reversible computing. The introduction of such computing paradigm has turned out to be bene... Click to show full abstract

Power consumption issues in VLSI circuits have resulted in the emergence of promising technologies – like reversible computing. The introduction of such computing paradigm has turned out to be bene...

Keywords: localization missing; approach detection; missing gate; faults reversible; gate faults; detection localization

Journal Title: Iete Journal of Research
Year Published: 2020

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