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A low sampling rate method for the monopole UWB impulse parameter monitoring using waveform transformation

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In ultra-wideband (UWB) impulse parameter monitoring, amplitude and pulse width measurements are crucial for detecting and classifying unknown impulse signals. Meanwhile, mass sampling data and the complexity of the current… Click to show full abstract

In ultra-wideband (UWB) impulse parameter monitoring, amplitude and pulse width measurements are crucial for detecting and classifying unknown impulse signals. Meanwhile, mass sampling data and the complexity of the current measurement technologies are the limitations of real-time and continuous monitoring. It urges to adopt a simple method that reduces the sampling rate without sacrificing accuracy. This article suggests a novel approach for the monopole UWB by analog signal preprocessing before sampling. A peak detector and integrator are utilized to retain the impulse amplitude and the area inside the impulse for a period, which is the so-called waveform transformation. A low-speed two-channel synchronous ADC samples the output signals from the peak detector and the integrator to determine the amplitude and the area. In the signal process, we demonstrate the concept that pulse width value equals the division of area and amplitude. Due to the distorted amplitude caused by the response time of the peak detector, the relationship between the distorted amplitude, the actual amplitude, and the pulse width is analyzed and examined based on the response function. Finally, the actual amplitude and pulse width are acquired and calculated by solving two equations. In terms of impulse waveform, rectangular and Gaussian waveform factors are developed and applied in the measurement. The proof-of-concept experimental results of a 0.68 V/ 18.8 ns rectangular impulse at a 10 Msps sampling rate is 0.711 V/ 17.00 ns with 4.56 %/ 9.57% relative error, tested and verified.

Keywords: uwb impulse; pulse width; impulse parameter; rate; parameter monitoring; sampling rate

Journal Title: Measurement Science and Technology
Year Published: 2023

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