Revision included surgical interventions for the lead and/or pulse generator. Device longevity, or time from original implant to revision, was analyzed by Kaplan-Meier analysis. RESULTS: Of 710 patients with device… Click to show full abstract
Revision included surgical interventions for the lead and/or pulse generator. Device longevity, or time from original implant to revision, was analyzed by Kaplan-Meier analysis. RESULTS: Of 710 patients with device interrogations, 132 (18.6%) were ‘cases' and had an AEI within the first 10 years of followup (Figure 1A). Of these, 11 (1.5%) were short circuits (<50U) and 121 (17%) were open circuits (>4,000U). The remaining 578 patients were ‘controls' and had normal impedances. Amongst patients with AEI, 41% (N[50/121) underwent revision, 58% (N[70/121) received device reprogramming, and 0.8% (N[1/121) pursued removal. Operative intervention was avoided in 54% (N[38/70) of the patients undergoing reprogramming. A 21% (N[121/578) revision rate was noted in the control group. Device longevity did not differ between cases and controls with regard to time from implant to revision (p[0.24, Figure 1 B). Interval from implant to device interrogation (AEI: 27.6 vs control: 23.3 months, p[0.16) nor interval from SNM interrogation to revision (AEI: 7.6 vs control: 9.8 months, p[0.24) differed between cases and controls. Cases with AEI that underwent reprogramming achieved a mean additional 17.3 months of device longevity prior to revision. CONCLUSIONS: The prevalence of AEI in SNM increases with duration of follow-up, however device reprogramming can avoid surgical revision in many cases.
               
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